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翻訳と辞書　辞書検索 [ 開発暫定版 ] スポンサード リンク Thin-film interference ： ウィキペディア英語版 Thin-film interference Thin-film interference occurs when incident light waves reflected by the upper and lower boundaries of a thin film interfere with one another to form a new wave. Studying this new wave can reveal information about the surfaces from which its components reflected, including the thickness of the film or the effective refractive index of the film medium. Thin films have many commercial applications including anti-reflection coatings, mirrors, and optical filters. ==Theory== A thin film is a layer of material with thickness in the sub-nanometer to micron range. As light strikes the surface of a film it is either transmitted or reflected at the upper surface. Light that is transmitted reaches the bottom surface and may once again be transmitted or reflected. The Fresnel equations provide a quantitative description of how much of the light will be transmitted or reflected at an interface. The light reflected from the upper and lower surfaces will interfere. The degree of constructive or destructive interference between the two light waves depends on the difference in their phase. This difference in turn depends on the thickness of the film layer, the refractive index of the film, and the angle of incidence of the original wave on the film. Additionally, a phase shift of 180° or $\backslash pi$ radians may be introduced upon reflection at a boundary depending on the refractive indices of the materials on either side of the boundary. This phase shift occurs if the refractive index of the medium the light is travelling through is less than the refractive of the material it is striking. In other words, if and the light is travelling from material 1 to material 2, then a phase shift occurs upon reflection. The pattern of light that results from this interference can appear either as light and dark bands or as colorful bands depending upon the source of the incident light. Consider light incident on a thin film and reflected by both the upper and lower boundaries. The optical path difference (OPD) of the reflected light must be calculated in order to determine the condition for interference. Referring to the ray diagram above, the OPD between the two waves is the following: :$OPD\; =\; n\_2\; (\backslash overline\; +\; \backslash overline)-\; n\_1(\backslash overline)$ Where, :$\backslash overline\; =\; \backslash overline\; =\; \backslash frac$ :$\backslash overline\; =\; 2d\backslash tan(\backslash theta\_2)\backslash sin(\backslash theta\_1)$ Using Snell's Law, $n\_1\backslash sin(\backslash theta\_1)=n\_2\backslash sin(\backslash theta\_2)$ :$OPD\; =\; n\_2\backslash left(\backslash frac\backslash right)\; -\; 2d\backslash tan(\backslash theta\_2)n\_2\backslash sin(\backslash theta\_2)$ :$OPD\; =\; 2n\_2d\backslash left(\backslash frac\backslash right)$ :$OPD\; =\; 2n\_2d\backslash cos\backslash big(\backslash theta\_2)$ Interference will be constructive if the optical path difference is equal to an integer multiple of the wavelength of light, $\backslash lambda$. :$2n\_2d\backslash cos\backslash big(\backslash theta\_2)=m\backslash lambda$ This condition may change after considering possible phase shifts that occur upon reflection. 抄文引用元・出典: フリー百科事典『 ウィキペディア（Wikipedia）』 ■ウィキペディアで「Thin-film interference」の詳細全文を読む スポンサード リンク 翻訳と辞書 : 翻訳のためのインターネットリソース Copyright(C) kotoba.ne.jp 1997-2016. All Rights Reserved.